Oxford Instruments NanoScience has signed a technology collaboration agreement with a Chinese firm to jointly develop high precision scanning probe microscopes (SPM).

The UK firm will work with CASmF Science and Technology (CASmF) to apply its superconducting magnet system known as TeslatronPT, to  a physical probe that scan 2D materials, nano-structures and superconductivity.

Dr Junyun LI, sales v-p at Oxford Instruments NanoScience, writes:

“This is a very prestigious collaboration for us with a Chinese high-tech company of such high repute developing world’s leading scientific research instruments.”

The preliminary results from this collaborative project using a simpler scanning tunnelling microscope (STM) measurement probe housed in the TeslatronPT platform have already demonstrated that atomically resolved graphite STM images can be obtained using the standard platform.

Dr Qingyou LU, the president of CASmF, writes:

“A time of tightly integrated hand shaking between Oxford Instruments’ strong market presence and emphasis on the technology innovation is bound to be a significant move towards achieving outstanding business results and efficiencies”.