Make a note for your diary, for a new Electronics Weekly webinar – Combining the Power of Functional Test and Embedded System Access. It’s on Wednesday 6 September, 10:00am (BST), it will be presented by industry expert Daniel Robertson, who specialises in Inspection / Boundary Scans.
Reduce test time
For example, learn how you can reduce test time and complex interface hardware through the use of Embedded JTAG Solutions.
Both developers and test planners are confronted with the same problem of ensuring sufficient access for test despite increasing miniaturization, says Daniel Robertson, along with a simultaneous increase in the functionality of modern electronics.
The free webinar will teach you all you need to know about this essential cost saving method, and how you can implement it on your upcoming projects.
The webinar will last one hour and will be free to view. Simply visit our website to book your place.
Who should attend?
Test engineers, test executives, production engineers, production executives, CEOs, contract designers and contract manufacturers, design engineers and design executives.